Ribbonization Defect Analysis & Copper Line Productivity Improvement
Published:February 1, 2014
Research Tags:
Optical FiberManufacturingQuality ControlTE Connectivity
Collaborating With: TE Connectivity
Global leader in connectivity and sensor solutions
Project Overview
This project involved research on Ribbonization Defect Analysis in Optical Fiber Cable and the Improvisation of Copper Line Productivity for RJ-45 cables, sponsored by TE Connectivity.
Funding Details
- Funding Agency: TE Connectivity
- Sanctioned Date: February 2014
- Amount: Rs. 24.7 Lakhs
Research Team
- Principal Investigator: Dr. Manohara Pai M.M, Professor, Dept. of I & CT, MIT, Manipal
- Co-Investigators:
- Dr. Radhika M Pai, Professor, Dept. of I & CT, MIT, Manipal
- Mr. Muralikrishna, Assistant Professor, Dept. of I & CT, MIT, Manipal
- Ms. Smitha, Assistant Professor, Dept. of I & CT, MIT, Manipal
- Ms. Pooja B, Assistant Professor, Dept. of I & CT, MIT, Manipal